BrightView's Wide Area Metrology (WAM) system is dedicated to in-line metrology of thin-film solar panels at full production throughput, providing monitoring and mapping of critical material and process parameters. The system was designed to support any format production, including Gen 5 and Gen 8.5 and to be easily retrofitted into existing production line. High resolution maps generated by the system form the basis for several process optimization solutions that support both line ramp-up, ongoing production and process enhancement, such as the transition from single junction to dual-junction cells.

The InSight M8 In-line Wide Area Metrology (WAM) Tool Optimizes Thin-Film Panel Manufacturing

A Field-Proven and Production-Worthy System

The WAM system has been validated and installed by leading manufacturers of a-Si and tandem thin-film panels and has proven its significant contribution to increasing panel efficiency and line productivity. The system is suitable for incorporation in existing production lines as well as installation into new ones.

The Insight M8 at a customer site

Features:

• Complete mapping of thickness, roughness and uniformity
• In-line, true-cell-measurements™ for immediate process feedback from actual production panels
• Simultaneous characterization of TCO and Si
• Patented non-contact single and dual-sided optical technology
• Proprietary analysis of multi-layer and single-layer measurements
• In-line measurement on qualification panels
• Remote monitoring, recipe tuning and software updates
• Intelligent Process Monitoring enhancement packages
• Real time alerts via email, SMS, texting and SECS/GEM

The Insight M8 at a customer site

The system provides an intuitive interface that is easily adopted by operators and engineers and includes state-of-the-art touch screen technology that enables simple transition between process overview, detailed panel analysis and various reports.