Debuting what it calls the first inline process control and optimization tool developed specifically for thin-film photovoltaics manufacturers, BrightView Systems has introduced its InSight M series monitoring system. Based on the company’s wide area metrology (WAM) technology, the platform features continuous monitoring and whole-panel mapping of critical and process parameters at full production throughput and for 100% of manufactured glass and flexible panels..........

Source: PV-tech.org - Jan 19th, 2010.

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